The FEI Titan Themis 300 is a state-of-the-art scanning transmission electron microscope. The Titan platform technology,  which is unmatched in mechanical, electronic, thermal, and optical stability is designed to deliver ultimate performance in TEM, STEM, diffraction and analytical modes to study nano structures in wide range of materials. The X-FEG electron gun provides high coherence and high brightness combined with stable emission currents for advanced analytical and high resolution applications. The high tension flexibility (60 to 300 kV) allows to optimize  the system according to the requirements of the specific experiment and material.