Scanning Electron MIcroscope Mira3 GMU
The TESCAN ORSAY HOLDING MIRA3 GMU is a variable-pressure field emission SEM using advanced technology, such as new improved high-performance electronics for fast image acquisition, an ultra-fast scanning system with compensation for static and dynamic image aberrations. The MIRA3 utilizes unique 4-lens electron optical design that provides a wide range of imaging and scanning modes, including: high resolution imaging (Resolution mode), ultra-low magnification imaging (Wide Field mode), high depth of field imaging (Depth mode), Live 3D Stereoscopic imaging, and Selected Area Electron Channeling (beam rocking for acquisition of electron diffraction images). The Mira3 SEM is fitted with dual Energy Dispersive Spectrometer system with large area elemental mapping capabilities and 3D surface rendering system as well as with a confocal Raman microscope for comprehensive correlative sample analysis.
The MIRA3 GMU was acquired with funding from the US Department of Defense to Dr. David Kisailus and it has been installed in November 2016.
Location
51E MS&E Building, UC Riverside main campus
Electron Optics
High Brightness Schottky field emitter
4-lens electron optical design
Resolution at High-vacuum SE mode
1.2 nm at 30 kV
2.5 nm at 3 kV
Resolution at High-vacuum In-Beam SE mode
1 nm at 30 kV
Resolution in low-vacuum mode LVSTD
1.5 nm at 30 kV
Resolition in Beam Deceleration Mode
1.5 nm at 3kV
2.5 nm at 200V
Maximum Field of View
100 mm
20 mm at 30 mm WD
Detectors
Retractable BSE Detector
In-Beam BSE Detector
In-Beam SE Detector
Low Vacuum Secondary Electron TESCAN Detector (LVSTD)
Analytical Systems
EDX
Bruker Nano GmbH QUANTAX 400 Energy Dispersive X-ray Spectrometer with
Dual 60 mm2 XFlash® detectors
Resolution 126 eV Mn Kα, 60 eV F Kα, 51 eV C Kα
Element detection range from beryllium (4) to americium (95)
QUANTAX 400 is a universal EDS system for qualitative and quantitative microanalysis of specimens with polished
or irregular surfaces, that incorporates sixth generation XFlash® Silicon Drift Detector and provides
extremely high throughput rates and improved light element detection capabilities.
Raman
Witec GmbH RISE laser confocal microscope system.
Laser: excitation wavelength: 532 nm, power 75 mW
Spectrometer UHTS 300
RISE Microscopy is combination of confocal Raman Imaging and Scanning Electron
Microscopy. It incorporates the sensitivity of the non-destructive, spectroscopic
Raman technique along with the atomic resolution of electron microscopy. Raman
Imaging enables the identification of molecules, their allotropes and polymorphs,
the determination of their orientation, purity and crystallinity, and the detection of
strain states.